Thickness-dependent crossover from charge- to strain-mediated magnetoelectric coupling in ferromagnetic/piezoelectric oxide heterostructures

ACS Nano

Volumn 8, Issue 1, 2014, Pages 894-903

  Spurgeon, Steven R ^a   Sloppy, Jennifer D ^a   Kepaptsoglou, Despoina Maria ^b   Balachandran, Prasanna V ^a   Nejati, Siamak ^a,f   Karthik, J ^c   Damodaran, Anoop R ^c   Johnson, Craig L ^a   Ambaye, Hailemariam ^d   Goyette, Richard ^d   Lauter, Valeria ^d   Ramasse, Quentin M ^b   Idrobo, Juan Carlos ^d   Lau, Kenneth K S ^a   Lofland, Samuel E ^e   Rondinelli, James M ^a   Martin, Lane W ^c   Taheri, Mitra L ^a  

^a Drexel University   (United States)

^b DARESBURY LABORATORY   (United Kingdom)

^c UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

^d OAK RIDGE NATIONAL LABORATORY   (United States)

^e ROWAN UNIVERSITY   (United States)

^f Yale University   (United States)

Author keywords

magnetoelectrics; polarized neutron reflectometry; spintronics; strain engineering; transmission electron microscopy

Indexed keywords

CHARACTERIZATION TECHNIQUES; MAGNETIZATION SUPPRESSION; MAGNETOELECTRIC COUPLINGS; MAGNETOELECTRICS; NEW INFORMATION AND COMMUNICATION TECHNOLOGIES; OXIDE HETEROSTRUCTURES; POLARIZED NEUTRON REFLECTOMETRY; STRAIN ENGINEERING;

FERROELECTRICITY; INFORMATION TECHNOLOGY; LOGIC DEVICES; MAGNETOELECTRONICS; MANGANESE OXIDE; NEUTRON REFLECTION; TRANSMISSION ELECTRON MICROSCOPY;

MAGNETIZATION;

EID: 84893467846     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn405636c     Document Type: Article

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