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Applied Physics Letters

Volumn 104, Issue 4, 2014, Pages

Probing graphene defects and estimating graphene quality with optical microscopy

(4) Lai, Shen a,b Kyu Jang, Sung a Jae Song, Young a,b Lee, Sungjoo a,b

a Sungkyunkwan University (South Korea)

b Sungkyunkwan University (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CONFOCAL RAMAN; FUNCTIONALIZATIONS; GRAPHENE DEFECTS; GRAPHENE FILMS; NON DESTRUCTIVE; SIMPLE APPROACH; THERMAL-ANNEALING;

ATOMIC FORCE MICROSCOPY; DEFECTS; OPTICAL DATA STORAGE; OPTICAL MICROSCOPY; PHOTOELECTRONS; SCANNING ELECTRON MICROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

GRAPHENE;

EID: 84893220108 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.4863080 Document Type: Article

Times cited : (13)

References (14)

1
- 79952275635
- 10.1021/nn102598m
- F. Banhart, J. Kotakoski, and A. V. Krasheninnikov, ACS Nano 5 (1), 26 (2011). 10.1021/nn102598m
- (2011) ACS Nano , vol.5 , Issue.1 , pp. 26
- Banhart, F.¹ Kotakoski, J.² Krasheninnikov, A.V.³

2
- 80052786480
- 10.1021/nl201590f
- J. Tian, H. Cao, W. Wu, Q. Yu, and Y. P. Chen, Nano Lett. 11 (9), 3663 (2011). 10.1021/nl201590f
- (2011) Nano Lett. , vol.11 , Issue.9 , pp. 3663
- Tian, J.¹ Cao, H.² Wu, W.³ Yu, Q.⁴ Chen, Y.P.⁵

3
- 78751642669
- 10.1038/nature09718
- P. Y. Huang, C. S. Ruiz-Vargas, A. M. van der Zande, W. S. Whitney, M. P. Levendorf, J. W. Kevek, S. Garg, J. S. Alden, C. J. Hustedt, Y. Zhu, J. Park, P. L. McEuen, and D. A. Muller, Nature 469, 389 (2011). 10.1038/nature09718
- (2011) Nature , vol.469 , pp. 389
- Huang, P.Y.¹ Ruiz-Vargas, C.S.² Van Der Zande, A.M.³ Whitney, W.S.⁴ Levendorf, M.P.⁵ Kevek, J.W.⁶ Garg, S.⁷ Alden, J.S.⁸ Hustedt, C.J.⁹ Zhu, Y.¹⁰ Park, J.¹¹ McEuen, P.L.¹² Muller, D.A.¹³

4
- 84878096004
- 10.1039/c3cc42464b
- S. U. Yu, Y. Cho, B. Park, N. Kim, I. S. Youn, M. Son, J. K. Kim, H. C. Choi, and K. S. Kim, Chem. Commun. 49, 5474 (2013). 10.1039/c3cc42464b
- (2013) Chem. Commun. , vol.49 , pp. 5474
- Yu, S.U.¹ Cho, Y.² Park, B.³ Kim, N.⁴ Youn, I.S.⁵ Son, M.⁶ Kim, J.K.⁷ Choi, H.C.⁸ Kim, K.S.⁹

5
- 84867337647
- 10.1038/nature11562
- D. L. Duong, G. H. Han, S. M. Lee, F. Gunes, E. S. Kim, S. T. Kim, H. Kim, Q. H. Ta, K. P. So, S. J. Yoon, S. J. Chae, Y. W. Jo, M. H. Park, S. H. Chae, S. C. Lim, J. Y. Choi, and Y. H. Lee, Nature 490, 235 (2012). 10.1038/nature11562
- (2012) Nature , vol.490 , pp. 235
- Duong, D.L.¹ Han, G.H.² Lee, S.M.³ Gunes, F.⁴ Kim, E.S.⁵ Kim, S.T.⁶ Kim, H.⁷ Ta, Q.H.⁸ So, K.P.⁹ Yoon, S.J.¹⁰ Chae, S.J.¹¹ Jo, Y.W.¹² Park, M.H.¹³ Chae, S.H.¹⁴ Lim, S.C.¹⁵ Choi, J.Y.¹⁶ Lee, Y.H.¹⁷

6
- 84887071063
- 10.1002/adfm.201300493
- T. H. Ly, D. L. Duong, Q. H. Ta, F. Yao, Q. A. Vu, H. Y. Jeong, S. H. Chae, and Y. H. Lee, Adv. Funct. Mater. 23, 5183 (2013). 10.1002/adfm.201300493
- (2013) Adv. Funct. Mater. , vol.23 , pp. 5183
- Ly, T.H.¹ Duong, D.L.² Ta, Q.H.³ Yao, F.⁴ Vu, Q.A.⁵ Jeong, H.Y.⁶ Chae, S.H.⁷ Lee, Y.H.⁸

7
- 84859124018
- 10.1021/ja3003809
- X. Feng, S. Maier, and M. Salmeron, J. Am. Chem. Soc. 134 (12), 5662 (2012). 10.1021/ja3003809
- (2012) J. Am. Chem. Soc. , vol.134 , Issue.12 , pp. 5662
- Feng, X.¹ Maier, S.² Salmeron, M.³

8
- 80054016356
- 10.1021/nl201980p
- G. H. Han, F. Güneş, J. J. Bae, E. S. Kim, S. J. Chae, H. J. Shin, J. Y. Choi, D. Pribat, and Y. H. Lee, Nano Lett. 11 (10), 4144 (2011). 10.1021/nl201980p
- (2011) Nano Lett. , vol.11 , Issue.10 , pp. 4144
- Han, G.H.¹ Güneş, F.² Bae, J.J.³ Kim, E.S.⁴ Chae, S.J.⁵ Shin, H.J.⁶ Choi, J.Y.⁷ Pribat, D.⁸ Lee, Y.H.⁹

9
- 84870402327
- 10.1021/nn302729j
- R. Larciprete, S. Ulstrup, P. Lacovig, M. Dalmiglio, M. Bianchi, F. Mazzola, L. Hornekær, F. Orlando, A. Baraldi, P. Hofmann, and S. Lizzit, ACS Nano 6 (11), 9551 (2012). 10.1021/nn302729j
- (2012) ACS Nano , vol.6 , Issue.11 , pp. 9551
- Larciprete, R.¹ Ulstrup, S.² Lacovig, P.³ Dalmiglio, M.⁴ Bianchi, M.⁵ Mazzola, F.⁶ Hornekær, L.⁷ Orlando, F.⁸ Baraldi, A.⁹ Hofmann, P.¹⁰ Lizzit, S.¹¹

10
- 84893208845
- See supplementary material at E-APPLAB-104-033404 for detailed annealing temperature analysis and full XPS spectra analysis of the graphene/Cu sample
- See supplementary material at http://dx.doi.org/10.1063/1.4863080 E-APPLAB-104-033404 for detailed annealing temperature analysis and full XPS spectra analysis of the graphene/Cu sample.

11
- 60749112055
- 10.1021/nl0808684
- L. Liu, S. Ryu, M. R. Tomasik, E. Stolyarova, N. Jung, M. S. Hybertsen, M. L. Steigerwald, L. E. Brus, and G. W. Flynn, Nano Lett. 8 (7), 1965 (2008). 10.1021/nl0808684
- (2008) Nano Lett. , vol.8 , Issue.7 , pp. 1965
- Liu, L.¹ Ryu, S.² Tomasik, M.R.³ Stolyarova, E.⁴ Jung, N.⁵ Hybertsen, M.S.⁶ Steigerwald, M.L.⁷ Brus, L.E.⁸ Flynn, G.W.⁹

12
- 84893316932
- 10.1088%2F1367-2630%2F15%2F3%2F035024
- P. B. László and L. Philippe, New J. Phys. 15 (3), 035024-1 (2013). 10.1088%2F1367-2630%2F15%2F3%2F035024
- (2013) New J. Phys. , vol.15 , Issue.3 , pp. 35024-35021
- László, P.B.¹ Philippe, L.²

13
- 77952259696
- 10.1038%2Fnnano.2010.53
- J. Lahiri, Y. Lin, P. Bozkurt, I. I. Oleynik, and M. Batzill, Nat. Nanotechnol. 5, 326 (2010). 10.1038%2Fnnano.2010.53
- (2010) Nat. Nanotechnol. , vol.5 , pp. 326
- Lahiri, J.¹ Lin, Y.² Bozkurt, P.³ Oleynik, I.I.⁴ Batzill, M.⁵

14
- 84869045999
- 10.1002/adfm.201200997
- K. C. Kwon, K. S. Choi, and S. Y. Kim, Adv. Funct. Mater. 22, 4724 (2012). 10.1002/adfm.201200997
- (2012) Adv. Funct. Mater. , vol.22 , pp. 4724
- Kwon, K.C.¹ Choi, K.S.² Kim, S.Y.³

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.