Beam tracking with micromegas & wire chambers in secondary electron detection configuration

Journal of Instrumentation

Volumn 8, Issue 12, 2013, Pages

  Vostinar M ^a   Fernandez B ^b   Pancin, J ^a   Alvarez, M A G ^b   Chaminade, T ^c   Damoy, S ^a   Dore D ^c   Drouart, A ^c   Druillole, F ^c   Fremont G ^a   Kebbiri, M ^c   Materna, T ^c   Monmarthe, E ^c   Panebianco, S ^c   Papaevangelou, T ^c   Riallot, M ^c   Savajols, H ^a   Spitaels, C ^a  

^a DIF   (France)

^b CSIC   (Spain)

^c CEA SACLAY   (France)

Author keywords

Heavy ion detectors; Micropattern gaseous detectors (MSGC, GEM, THGEM, RETHGEM, MHSP, MICROPIC, MICROMEGAS, InGrid, etc); Particle tracking detectors (Gaseous detectors); Wire chambers (MWPC, Thin gap chambers, drift chambers, drift tubes, proportional chambers etc)

Indexed keywords

DRIFT TUBE; GASEOUS DETECTORS; HEAVY-ION DETECTORS; SECONDARY ELECTRON DETECTION; SECONDARY ELECTRONS; SPATIAL PROPERTIES; SPATIAL RESOLUTION; TIME OF FLIGHT METHOD;

DRIFT CHAMBERS; GAS DETECTORS; IMAGE RESOLUTION; IONIZATION CHAMBERS; SECONDARY EMISSION; WIRE;

PARTICLE BEAM TRACKING;

EID: 84892864774     PISSN: None     EISSN: 17480221     Source Type: Journal    
DOI: 10.1088/1748-0221/8/12/C12023     Document Type: Article

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