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Volumn , Issue , 2006, Pages

Performance benchmarks for passive UHF RFID tags

Author keywords

[No Author keywords available]

Indexed keywords

BENCHMARK SUITES; PASSIVE UHF RFID; UHF RFID TAGS;

EID: 84892629650     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (71)

References (15)
  • 8
  • 9
    • 84892644419 scopus 로고    scopus 로고
    • EPCTM generation 1 tag data standards, version 1.1 revision 1.27
    • EPCglobal Inc.
    • EPCglobal Inc.: EPCTM generation 1 tag data standards, version 1.1 revision 1.27. Technical report, EPCglobal Inc. (2005)
    • (2005) Technical Report, EPCglobal Inc
  • 10
    • 84892643924 scopus 로고    scopus 로고
    • EPC radio frequency identification protocols class-1 generation-2 UHF RFID protocols for communication at 860-960 MHz, version 1.09
    • EPCglobal Inc.
    • EPCglobal Inc.: EPC radio frequency identification protocols class-1 generation-2 UHF RFID protocols for communication at 860-960 MHz, version 1.09. Technical report, EPCglobal Inc. (2005)
    • (2005) Technical Report, EPCglobal Inc
  • 12
    • 2642534939 scopus 로고    scopus 로고
    • On the future of RFID tags and protocols
    • Massachusetts Institute of Technology
    • Sarma, S., Engels, D.W.: On the future of RFID tags and protocols. White paper, Auto-ID Center, Massachusetts Institute of Technology (2003)
    • (2003) White Paper, Auto-ID Center
    • Sarma, S.1    Engels, D.W.2
  • 13
    • 84892650583 scopus 로고    scopus 로고
    • Auto-ID center: Draft proposal specification for a 900 mhz class 0 radio frequency identification tag
    • Auto-ID Center: Draft proposal specification for a 900 mhz class 0 radio frequency identification tag. Technical report, Auto-ID Center (2003)
    • (2003) Technical Report, Auto-ID Center
  • 14
    • 77956427419 scopus 로고    scopus 로고
    • Towards RFID peformance benchmark tests
    • Massachusetts Institute of Technology
    • Eberhardt, N.: Towards RFID peformance benchmark tests. Technical report, Auto-ID Center, Massachusetts Institute of Technology (2002)
    • (2002) Technical Report, Auto-ID Center
    • Eberhardt, N.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.