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Physical Review B - Condensed Matter and Materials Physics

Volumn 88, Issue 24, 2013, Pages

Experimental verification of the surface termination in the topological insulator TlBiSe2 using core-level photoelectron spectroscopy and scanning tunneling microscopy

(13) Kuroda, Kenta a Ye, Mao a,b Schwier, Eike F a Nurmamat, Munisa a Shirai, Kaito a Nakatake, Masashi a Ueda, Shigenori c Miyamoto, Koji a Okuda, Taichi a Namatame, Hirofumi a Taniguchi, Masaki a Ueda, Yoshifumi d Kimura, Akio a

a HIROSHIMA UNIVERSITY (Japan)

b SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY (China)

c NATIONAL INSTITUTE FOR MATERIALS SCIENCE (Japan)

d KURE NATIONAL COLLEGE OF TECHNOLOGY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84892382371 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.88.245308 Document Type: Article

Times cited : (26)

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