Accessing select properties of the electron with ImageJ: An open-source image-processing paradigm

European Journal of Physics

Volumn 35, Issue 1, 2014, Pages

  Alam, Junaid ^a   Shaheen, Amrozia ^a   Anwar, Muhammad Sabieh ^a  

^a LAHORE UNIVERSITY OF MANAGEMENT SCIENCES   (Pakistan)

Author keywords

charge to mass ratio; digital photography; electron diffraction; image processing; laboratory experiment

Indexed keywords

ELECTRON DIFFRACTION; ELECTRONS; PHOTOGRAPHY;

CHARGE-TO-MASS RATIOS; CONCENTRIC RINGS; DIGITAL PHOTOGRAPHY; IMAGES PROCESSING; LABORATORY EXPERIMENTS; MAGNETIC-FIELD; OPEN-SOURCE; PROPERTY; RADII OF CURVATURE; SOURCE IMAGES;

OPEN SOURCE SOFTWARE;

EID: 84891949520     PISSN: 01430807     EISSN: 13616404     Source Type: Journal    
DOI: 10.1088/0143-0807/35/1/015011     Document Type: Article

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