메뉴 건너뛰기




Volumn 22, Issue 1, 2014, Pages 185-190

Evaluation of leakage reduction alternatives for deep submicron dynamic nonuniform cache architecture caches

Author keywords

Leakage reduction techniques; nonuniform cache architecture (NUCA) cache; power consumption; wire delay

Indexed keywords

LEAKAGE POWER CONSUMPTION; LEAKAGE REDUCTION TECHNIQUES; MIGRATION MECHANISMS; NON-UNIFORM CACHE ARCHITECTURE; NON-UNIFORM CACHE ARCHITECTURES; PROCESS VARIATION; STATIC RANDOM ACCESS MEMORY; WIRE DELAYS;

EID: 84891793521     PISSN: 10638210     EISSN: None     Source Type: Journal    
DOI: 10.1109/TVLSI.2012.2231949     Document Type: Article
Times cited : (17)

References (26)
  • 4
    • 10744231529 scopus 로고    scopus 로고
    • NUCA: A non-uniform cache access architecture for wire-delay dominated on-chip caches
    • Nov -Dec
    • C. Kim, D. C. Burger, and S. W. Keckler, NUCA: A non-uniform cache access architecture for wire-delay dominated on-chip caches, IEEE Micro, vol. 23, no. 6, pp. 99-107, Nov.-Dec. 2003.
    • (2003) IEEE Micro , vol.23 , Issue.6 , pp. 99-107
    • Kim, C.1    Burger, D.C.2    Keckler, S.W.3
  • 8
    • 0345757132 scopus 로고    scopus 로고
    • Let caches decay: Reducing leakage via exploitation of generational behaviour
    • Z. Hu, S. Kaxiras, and M. Martonosi, Let caches decay: Reducing leakage via exploitation of generational behaviour, ACM Trans. Comput. Syst., vol. 20, no. 2, pp. 161-190, 2002.
    • (2002) ACM Trans. Comput. Syst. , vol.20 , Issue.2 , pp. 161-190
    • Hu, Z.1    Kaxiras, S.2    Martonosi, M.3
  • 12
    • 56849129583 scopus 로고    scopus 로고
    • Techniques to extend canary-based standby VDD scaling for SRAMs to 45 nm and beyond
    • Nov
    • J. Wang and B. H. Calhoun, Techniques to extend canary-based standby VDD scaling for SRAMs to 45 nm and beyond, IEEE J. Solid-State Circuits, vol. 43, no. 11, pp. 2514-2523, Nov. 2008.
    • (2008) IEEE J. Solid-State Circuits , vol.43 , Issue.11 , pp. 2514-2523
    • Wang, J.1    Calhoun, B.H.2
  • 19
    • 84886736952 scopus 로고    scopus 로고
    • New generation of predictive technology model for sub-45 nm design exploration
    • Mar.
    • W. Zhao and Y. Cao, New generation of predictive technology model for sub-45 nm design exploration, in Proc. 7th Int. Symp. Quality Electron. Design, Mar. 2006, pp. 590-596.
    • (2006) Proc. 7th Int. Symp. Quality Electron. Design , pp. 590-596
    • Zhao, W.1    Cao, Y.2
  • 20
    • 70350060187 scopus 로고    scopus 로고
    • ORION 2.0: A fast and accurate NoC power and area model for early-stage design space exploration
    • Apr.
    • A. B. Kahng, B. Li, L. S. Peh, and K. Samadi, ORION 2.0: A fast and accurate NoC power and area model for early-stage design space exploration, in Proc. Design Autom. Test Eur., Apr. 2009, pp. 423-428.
    • (2009) Proc. Design Autom. Test Eur. , pp. 423-428
    • Kahng, A.B.1    Li, B.2    Peh, L.S.3    Samadi, K.4
  • 23
    • 79959246336 scopus 로고    scopus 로고
    • New category ultra-thin notchless 6T SRAM cell layout topologies for sub-22 nm
    • Quality Electron. Design, Mar.
    • R. Mann and B. Calhoun, New category ultra-thin notchless 6T SRAM cell layout topologies for sub-22 nm, in Proc. 12th Int. Symp., Quality Electron. Design, Mar. 2011, pp. 425-430.
    • (2011) Proc. 12th Int. Symp. , pp. 425-430
    • Mann, R.1    Calhoun, B.2
  • 25
    • 23844470184 scopus 로고    scopus 로고
    • Standby supply voltage minimization for deep sub-micron SRAM
    • H. Qin, Y. Cao, D. Markovic, A. Vladimirescu, and J. Rabaey, Standby supply voltage minimization for deep sub-micron SRAM, Microelectron. J., vol. 36, no. 9, pp. 789-800, 2005.
    • (2005) Microelectron. J. , vol.36 , Issue.9 , pp. 789-800
    • Qin, H.1    Cao, Y.2    Markovic, D.3    Vladimirescu, A.4    Rabaey, J.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.