Neighborhood repulsed metric learning for kinship verification

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 36, Issue 2, 2014, Pages 331-345

  Lu, Jiwen ^a   Zhou, Xiuzhuang ^b   Tan, Yap Pen ^c   Shang, Yuanyuan ^b   Zhou, Jie ^d  

^a ADVANCED DIGITAL SCIENCES CENTER   (Singapore)

^b CAPITAL NORMAL UNIVERSITY   (China)

^c NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^d TSINGHUA UNIVERSITY   (China)

Author keywords

biometrics; Face and gesture recognition; kinship verification; metric learning; multiview learning

Indexed keywords

DISTANCE METRICS; FACE AND GESTURE RECOGNITION; HUMAN ABILITIES; HUMAN OBSERVERS; METRIC LEARNING; MULTI-VIEW LEARNING; MULTIPLE FEATURE DESCRIPTORS; MULTIPLE FEATURE FUSION;

ARTIFICIAL INTELLIGENCE; COMPUTER VISION;

BIOMETRICS;

ALGORITHM; ARTICLE; ARTIFICIAL INTELLIGENCE; AUTOMATED PATTERN RECOGNITION; BIOMETRY; COMPARATIVE STUDY; COMPUTER ASSISTED DIAGNOSIS; FACE; HISTOLOGY; HUMAN; IMAGE ENHANCEMENT; METHODOLOGY; PHYSIOLOGY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; VISION;

ALGORITHMS; ARTIFICIAL INTELLIGENCE; BIOMETRY; FACE; HUMANS; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; PATTERN RECOGNITION, AUTOMATED; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; VISUAL PERCEPTION;

EID: 84891618103     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPAMI.2013.134     Document Type: Article

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