High-resolution thermal imaging with a combination of nano-focus X-ray diffraction and ultra-fast chip calorimetry

Journal of Synchrotron Radiation

Volumn 21, Issue 1, 2014, Pages 223-228

  Rosenthal, Martin ^a   Doblas, David ^b,c   Hernandez, Jaime J ^b   Odarchenko, Yaroslav I ^b   Burghammer, Manfred ^d   Di Cola, Emanuela ^d   Spitzer, Denis ^c   Antipov, A E ^a   Aldoshin, L S ^a   Ivanov, Dimitri A ^a,b  

^a MOSCOW STATE UNIVERSITY   (Russian Federation)

^b CNRS   (France)

^c FRENCH GERMAN RESEARCH INSTITUTE OF SAINT LOUIS   (France)

^d EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

indium; micro focus X ray diffraction; modulated differential scanning calorimetry; nanocalorimetry

Indexed keywords

CALORIMETRIC MEASUREMENTS; CHEMICAL TRANSFORMATIONS; HETEROGENEOUS MATERIALS; MEASURED TEMPERATURES; MICRO FOCUS; MODULATED DIFFERENTIAL SCANNING CALORIMETRY; NANOCALORIMETRY; TEMPERATURE MODULATION;

CALORIMETERS; DIFFERENTIAL SCANNING CALORIMETRY; INDIUM; X RAY DIFFRACTION;

INFRARED IMAGING;

EID: 84891611689     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S1600577513024892     Document Type: Article

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