Beam profile evolution and beam quality changes inside a diode-end-pumped laser oscillator

IEEE Journal of Quantum Electronics

Volumn 50, Issue 2, 2014, Pages 62-67

  Ye, Zhibin ^a   Zhao, Zhigang ^a,b   Pan, Sunqiang ^a   Zhang, Xiang ^a   Wang, Chunhua ^a   Qi, Yunxuan ^a   Liu, Chong ^a   Xiang, Zhen ^a   Ge, Jianhong ^a  

^a ZHEJIANG UNIVERSITY   (China)

^b UNIVERSITY OF TOKYO   (Japan)

Author keywords

Beam filling factor; Diode end pumped; Laser beam; Laser oscillator; Thermal effects

Indexed keywords

BEAM INTENSITY; COUNTER-PROPAGATING BEAM; DIODE END-PUMPED; FILLING FACTOR; FUNDAMENTAL MODES; LASER OSCILLATORS; QUALITY CHANGE; THERMALLY INDUCED;

HIGH POWER LASERS; LASER BEAMS; PUMPING (LASER); THERMAL EFFECTS;

DIODES;

EID: 84891586725     PISSN: 00189197     EISSN: None     Source Type: Journal    
DOI: 10.1109/JQE.2013.2294362     Document Type: Article

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