Low kV scanning electron microscopy

Scanning Microscopy for Nanotechnology: Techniques and Applications

Volumn , Issue , 2007, Pages 101-119

  Frey, M David ^a  

^a CARL ZEISS SMT AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84891398474     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1007/978-0-387-39620-0_4     Document Type: Chapter

References (8)

1. E. D. Boyes, Microsc. Microanal., 6(2000) 0.
2. J. Goldstein, D. E. Newbury, D. C. Joy, et al., Scanning Electron Microscopy and X-Ray Microanalysis, 3rd edition, Kluwer Academic/Plenum Publishers, New York (2003).
3. J. Y. Liu, Microsc. Microanal., 8 (Suppl. 2) (2002).
4. D. C. Joy, Microsc. Microanal., 8 (Suppl. 2) (2002).
5. J. Goldstein, D. E. Newbury, D. C. Joy, et al., Scanning Electron Microscopy and X-ray Microanalysis, 3rd edition, Kluwer Academic/Plenum Publishers, New York (2003). Supplemental CD.
6. D. C. Joy and D. Newbury, Low voltage scanning electron microscopy, Microsc. Today, 10(2) (2002).
7. I. Müllerová and L. Frank, Contrast mechanisms in the scanning low energy electron microscopy, Microsc. Microanal., 9 (Suppl. 3), Microscopy Society of America (2003).
8. W. C. Oliver, Low voltage scanning electron microscopy, Microsc. Today, 10(3) (2002).