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Volumn 1, Issue 2, 2012, Pages 100-103
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Meshing power quality and electromagnetic compatibility for tomorrow's smart grid
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 84890868061
PISSN: 21622264
EISSN: 21622272
Source Type: Trade Journal
DOI: 10.1109/MEMC.2012.6244982 Document Type: Article |
Times cited : (23)
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References (5)
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