The effects of noise on ultrashort optical pulse measurement using SPIDER

Optics InfoBase Conference Papers

Volumn , Issue , 2000, Pages 21-23

  Kosik, Ellen M ^a   Anderson, Matthew E ^a   de Araujo, Luís E E ^a   Walmsley, Ian A ^a  

^a UNIVERSITY OF ROCHESTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

QUANTUM ELECTRONICS;

DIRECT ELECTRIC FIELD RECONSTRUCTION; EFFECT OF NOISE; HIGH-FIDELITY; OPTICAL PULSE MEASUREMENT; OPTIMAL PARAMETER; SPECTRAL PHASE INTERFEROMETRY FOR DIRECT ELECTRIC FIELD; ULTRA SHORT OPTICAL PULSE; ULTRASHORT PULSE CHARACTERIZATION;

ELECTRIC FIELDS;

EID: 84890806662     PISSN: None     EISSN: 21622701     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)

1. C. Iaconis, I. A. Walmsley: Opt. Lett. 23, 792 (1998)
2. C. Iaconis, I. A. Walmsley: IEEE J. Quantum Electron. 35,501 (1999).
3. D. N. Fittinghoff, K. W. DeLong, R. Trebino, C. L. Ladera: J. Opt. Soc. Am. B 12, 1955 (1995).
4. T. M. Shuman, M. E. Anderson, J. Bromage, C. Iaconis, L. Waxer, I. A. Walmsley: Optics Express 5,134 (1999).