메뉴 건너뛰기




Volumn , Issue , 2012, Pages

Modeling light transmission in silicon waveguides

Author keywords

[No Author keywords available]

Indexed keywords

DISTRIBUTION FUNCTIONS; SILICON; WAVEGUIDES;

EID: 84890750705     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1364/cleo_si.2012.cm4a.1     Document Type: Conference Paper
Times cited : (2)

References (4)
  • 1
  • 2
    • 29344461523 scopus 로고    scopus 로고
    • Optical vector network analyzer for single-scan measurements of loss, group delay, and polarization mode dispersion
    • D. K. Gifford, B. J. Soller, M. S.Wolfe, and M. E. Froggatt, "Optical vector network analyzer for single-scan measurements of loss, group delay, and polarization mode dispersion," Appl. Opt. 44(34), pp. 7282-7286 (2005).
    • (2005) Appl. Opt , vol.44 , Issue.34 , pp. 7282-7286
    • Gifford, D.K.1    Soller, B.J.2    Wolfe, M.S.3    Froggatt, M.E.4
  • 3
    • 79957666620 scopus 로고    scopus 로고
    • Filter-less amplification for rapid swept wavelength interferometric measurement of silicon nanophotonic waveguide group delay statistics
    • M. L. Cooper, M. A. Schneider, G. Gupta, and S. Mookherjea "Filter-less amplification for rapid swept wavelength interferometric measurement of silicon nanophotonic waveguide group delay statistics" IEEE Photon. Tech., Lett. 23(12), pp. 783-785 (2011).
    • (2011) IEEE Photon. Tech., Lett , vol.23 , Issue.12 , pp. 783-785
    • Cooper, M.L.1    Schneider, M.A.2    Gupta, G.3    Mookherjea, S.4
  • 4
    • 74949124738 scopus 로고    scopus 로고
    • Roughness Induced Backscattering in Optical Silicon Waveguides
    • F. Morichetti, et al. "Roughness Induced Backscattering in Optical Silicon Waveguides", Phys. Rev. Lett. 104, 033902 (2010).
    • (2010) Phys. Rev. Lett , vol.104 , pp. 033902
    • Morichetti, F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.