Multifractal characterization of single wall carbon nanotube thin films surface upon exposure to optical parametric oscillator laser irradiation

Applied Surface Science

Volumn 289, Issue , 2014, Pages 97-106

  Ţǎlu, Ştefan ^a   Marković, Zoran ^b   Stach, Sebastian ^c   Todorovic Markovic B ^b   Ţǎlu, Mihai ^d  

^a TECHNICAL UNIVERSITY OF CLUJ NAPOCA   (Romania)

^b UNIVERSITY OF BELGRADE   (Serbia)

^c UNIVERSITY OF SILESIA   (Poland)

^d UNIVERSITY OF CRAIOVA   (Romania)

Author keywords

Atomic force microscopy; Multifractal analysis; OPO laser; Surface roughness; SWCNTs

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARBON FILMS; FRACTALS; IRRADIATION; MICA; OPTICAL FILMS; OPTICAL PARAMETRIC OSCILLATORS; PARAMETER ESTIMATION; SILICATE MINERALS; SURFACE ROUGHNESS; THIN FILMS; YARN;

CARBON NANOTUBE FILMS; GENERALIZED DIMENSION; MORPHOLOGICAL CHANGES; MULTIFRACTAL ANALYSIS; MULTIFRACTAL CHARACTERIZATION; STATISTICAL PARAMETERS; STRUCTURAL EVOLUTION; SWCNTS;

SINGLE-WALLED CARBON NANOTUBES (SWCN);

EID: 84890558770     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2013.10.114     Document Type: Article

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