Impedance spectroscopy and dielectric properties of flash versus conventionally sintered yttria-doped zirconia electroceramics viewed at the microstructural level

Journal of the American Ceramic Society

Volumn 96, Issue 12, 2013, Pages 3760-3767

  M'Peko, J C ^a,b   Francis, J S C ^a   Raj, Rishi ^a  

^a University of Colorado at Boulder   (United States)

^b UNIVERSITY OF SÃO PAULO   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

CONVENTIONAL SINTERING; DENSITY-DEPENDENT; IMPEDANCE SPECTROSCOPY; MICROSTRUCTURAL LEVELS; RELAXATION FREQUENCY; SINTERED SPECIMEN; SPACE-CHARGE LAYERS; YTTRIA-DOPED ZIRCONIA;

CERAMIC MATERIALS; ELECTRIC FIELDS; GRAIN BOUNDARIES; IONIC CONDUCTION; PERMITTIVITY; SPECTROSCOPY; SURFACE DEFECTS;

SINTERING;

EID: 84890315827     PISSN: 00027820     EISSN: 15512916     Source Type: Journal    
DOI: 10.1111/jace.12567     Document Type: Article

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