A novel electro-thermal model for wide bandgap semiconductor based devices

2013 15th European Conference on Power Electronics and Applications, EPE 2013

Volumn , Issue , 2013, Pages

  Sintamarean, C ^a   Blaabjerg, F ^a   Wang, H ^a  

^a AALBORG UNIVERSITY   (Denmark)

Author keywords

Electro Thermal Model; Junction Case temperature estimation; Safe Operation Area; Thermal coupling; Thermal Cycling

Indexed keywords

ELECTRO-THERMAL MODEL; JUNCTION TEMPERATURES; SAFE OPERATING AREA; SAFE OPERATION AREA; TEMPERATURE ESTIMATION; TEMPERATURE VARIATION; THERMAL COUPLING; WIDE-BAND-GAP SEMICONDUCTOR;

ESTIMATION; POWER ELECTRONICS; SEMICONDUCTOR JUNCTIONS; SILICON CARBIDE; TEMPERATURE DISTRIBUTION; THERMAL CYCLING; THERMOGRAPHY (TEMPERATURE MEASUREMENT);

MOSFET DEVICES;

EID: 84890165380     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EPE.2013.6631982     Document Type: Conference Paper

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