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Volumn 122, Issue , 2014, Pages 348-355
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Structural, optical, electron paramagnetic, thermal and dielectric characterization of chalcopyrite
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Author keywords
Chalcopyrite; Dielectric studies; FTIR and FT raman; Optical absorption; Thermal analysis; X ray diffraction
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Indexed keywords
CHALCOPYRITE;
DIELECTRIC CHARACTERIZATION;
DIELECTRIC STUDIES;
EFFECTIVE ACTIVATION ENERGY;
FT-RAMAN;
PREEXPONENTIAL FACTOR;
SPECTROSCOPIC TECHNIQUE;
THERMAL DECOMPOSITION BEHAVIOR;
DECOMPOSITION;
DIELECTRIC LOSSES;
LIGHT ABSORPTION;
THERMOANALYSIS;
THERMOGRAVIMETRIC ANALYSIS;
X RAY DIFFRACTION;
HEATING RATE;
CHALCOPYRITE;
COPPER;
POWDER;
CHEMISTRY;
DIFFERENTIAL SCANNING CALORIMETRY;
ELECTRICITY;
ELECTRON;
ELECTRON SPIN RESONANCE;
INFRARED SPECTROSCOPY;
POWDER;
RAMAN SPECTROMETRY;
SCANNING ELECTRON MICROSCOPY;
SPECTROMETRY;
TEMPERATURE;
THERMOGRAVIMETRY;
ULTRAVIOLET SPECTROPHOTOMETRY;
VIBRATION;
X RAY DIFFRACTION;
COPPER;
DIFFERENTIAL THERMAL ANALYSIS;
ELECTRICITY;
ELECTRON SPIN RESONANCE SPECTROSCOPY;
ELECTRONS;
MICROSCOPY, ELECTRON, SCANNING;
POWDERS;
SPECTROMETRY, X-RAY EMISSION;
SPECTROPHOTOMETRY, ULTRAVIOLET;
SPECTROSCOPY, FOURIER TRANSFORM INFRARED;
SPECTRUM ANALYSIS, RAMAN;
TEMPERATURE;
THERMOGRAVIMETRY;
VIBRATION;
X-RAY DIFFRACTION;
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EID: 84890097734
PISSN: 13861425
EISSN: None
Source Type: Journal
DOI: 10.1016/j.saa.2013.10.065 Document Type: Article |
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Times cited : (8)
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References (44)
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