Test stand for non-uniformity correction of microbolometer focal plane arrays used in thermal cameras

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 8896, Issue , 2013, Pages

  Krupiński, Michal ^a   Barela, Jaroslaw ^a   Firmanty, Krzysztof ^a   Kastek, Mariusz ^a  

^a MILITARY UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

Non uniformity correction microbolometer FPA

Indexed keywords

CORRECTION COEFFICIENTS; DIGITAL DATA PROCESSING; FIXED PATTERN NOISE; HIGH TEMPERATURE STABILITY; IMAGE DEGRADATION; MEASUREMENT STAND; MICROBOLOMETER; NONUNIFORMITY CORRECTION;

BOLOMETERS; DATA PROCESSING; ELECTROMAGNETIC WAVE EMISSION; FOCAL PLANE ARRAYS; INFRARED RADIATION; RADIATION; TEMPERATURE SENSORS;

INFRARED DEVICES;

EID: 84890082978     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.2028633     Document Type: Conference Paper

References (6)

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