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Volumn 103, Issue 19, 2013, Pages

Ultrafast carrier dynamics in single-crystal In2Se3 thin layers

Author keywords

[No Author keywords available]

Indexed keywords

AUGER PROCESS; CARRIER DYNAMICS; CARRIER RECOMBINATION DYNAMICS; FEMTOSECONDS; LAYER THICKNESS; PHOTOCURRENT MEASUREMENT; TIME CONSTANTS; ULTRAFAST CARRIER DYNAMICS;

EID: 84889772578     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4828558     Document Type: Article
Times cited : (19)

References (12)
  • 4
    • 0034921439 scopus 로고    scopus 로고
    • 10.1146/annurev.physchem.52.1.193
    • A. J. Nozik, Annu. Rev. Phys. Chem. 52, 193 (2001). 10.1146/annurev. physchem.52.1.193
    • (2001) Annu. Rev. Phys. Chem. , vol.52 , pp. 193
    • Nozik, A.J.1
  • 6
    • 84881561449 scopus 로고    scopus 로고
    • 10.1021/nl400888p
    • X. Tao and Y. Gu, Nano Lett. 13, 3501 (2013). 10.1021/nl400888p
    • (2013) Nano Lett. , vol.13 , pp. 3501
    • Tao, X.1    Gu, Y.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.