Analysis of NaF precursor layers during the different stages of the Cu(In,Ga)Se2 co-evaporation process

Materials Research Society Symposium Proceedings

Volumn 1538, Issue , 2013, Pages 9-14

  Edoff, M ^a   Salome P M P ^a   Hultqvist, A ^a   Fjallstrom V ^a  

^a UPPSALA UNIVERSITY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

EVAPORATION; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; MOLYBDENUM METALLOGRAPHY; PREHEATING; SECONDARY ION MASS SPECTROMETRY; SODIUM COMPOUNDS; X RAY PHOTOELECTRON SPECTROSCOPY;

BACK CONTACT; CO-EVAPORATIONS; CU(IN ,GA)SE2; DIFFERENT STAGES; PRECURSOR LAYER; SIMS ANALYSIS; TEM ANALYSIS; TEM IMAGES;

COPPER COMPOUNDS;

EID: 84889646074     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/opl.2013.998     Document Type: Conference Paper

References (6)

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