Spectral Color Measurement

Colorimetry: Understanding the CIE System

Volumn , Issue , 2007, Pages 101-134

  Ohno, Yoshi ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Corrections of error methods; Spectral color measurement; Wavelength scale error

Indexed keywords

EID: 84889431119     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1002/9780470175637.ch5     Document Type: Chapter

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