Copper oxide nanoparticles for thin film photovoltaics

Materials Research Society Symposium Proceedings

Volumn 1494, Issue , 2013, Pages 333-338

  Nuys, Maurice ^a   Flohre, Jan ^a   Leidinger, Christine ^a   Koḧler, Florian ^a   Carius, Reinhard ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING TEMPERATURES; ANNEALING TREATMENTS; COPPER OXIDE NANOPARTICLES; PHOTOTHERMAL DEFLECTION SPECTROSCOPY; PHOTOVOLTAIC APPLICATIONS; STRUCTURAL AND ELECTRONIC PROPERTIES; THIN FILM PHOTOVOLTAICS; X-RAY DIFFRACTION MEASUREMENTS;

ELECTRONIC PROPERTIES; LASER RADIATION; NANOPARTICLES; THIN FILMS; X RAY DIFFRACTION;

ANNEALING;

EID: 84889261464     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/opl.2013.259     Document Type: Conference Paper

References (17)

1. F. P. Koffyberg, and F. A. Benko, Journal of Applied Physics 53(2), 1173 (1982)
2. A. Roos, and B. Karlsson, Solar Energy Materials 7, 467 (1983)
3. J.B. Grun, M. Sieskind, and S. Nikitine, Journal of Physics and Chemistry of Solids 19, 819 (1961)
4. R. Elliott, Physical Review 124, 340 (1961)
5. L.O. Grondahl, and P.H. Geiger, J. Am. Inst. Elec. Eng. 46, 215 (1927)
6. B.P. Rai, Solar Cells 25(3), 265 (1988)
7. B.K. Meyer et al., Physica status solidi (b), 1 (2012)
8. W.B. Jackson, N.M. Amer, A.C. Boccara, and D. Fournier, Applied Optics 20, 1333 (1981)
9. S. Asbrink, and L.J. Norrby, Acta Cryst. B26, 8 (1970)
10. J. Chrzanowski, and J.C. Irwin, Solid State Communications 70, 11 (1989)
11. J. Reydellet, Phys. Stat. Sol. (b) 52, 175 (1972)
12. D. Balzar, Voigt-function model in diffraction line-broadening analysis. - Microstructure Analysis from Diffraction, edited by R.L. Snyder, H.J. Bunge, and J. Fiala, International Union of Crystallography, (1999)
13. Bruker AXS TOPAS V4: General profile and structure analysis software for powder diffraction data (2008)
14. F.L. Weichman, and J.M. Reyes, Canadian Journal of Physics 58, 325 (1980)
15. D.W. Snoke, A.J. Shields, and M. Cardona, Phys. Rev. B 45, 693 (1992)
16. J. Bloem, A.J. Van der Houven van Oordt, and F.A. Kröger, Physica 22, 1254 (1956)
17. T. Ito, and T. Masumi, J. Phys. Soc. Jpn. 66, 2185 (1997)