Fast-scan controlled-adsorption voltammetry for the quantification of absolute concentrations and adsorption dynamics

Langmuir

Volumn 29, Issue 48, 2013, Pages 14885-14892

  Atcherley, Christopher W ^a   Laude, Nicholas D ^a   Parent, Kate L ^a   Heien, Michael L ^a  

^a University of Arizona   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION DYNAMICS; BACKGROUND SUBTRACTION; DIFFUSION-CONTROLLED; DIRECT MEASUREMENT; FAST SCAN CYCLIC VOLTAMMETRY; FINITE-DIFFERENCE MODELING; LIMIT OF DETECTION; MEASUREMENT TOOLS;

ADSORPTION; AMINES; COMPUTER SIMULATION; CYCLIC VOLTAMMETRY; NEUROPHYSIOLOGY;

MEASUREMENTS;

EID: 84889063705     PISSN: 07437463     EISSN: 15205827     Source Type: Journal    
DOI: 10.1021/la402686s     Document Type: Article

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