X-ray Thomson scattering for partially ionized plasmas including the effect of bound levels

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 8849, Issue , 2013, Pages

  Nilsen, Joseph ^a   Johnson, Walter R ^b   Cheng, K T ^a  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF NOTRE DAME   (United States)

Author keywords

X FEL; X ray Thomson scattering

Indexed keywords

ELECTRON SOURCES; EXPERIMENTS; FREE ELECTRON LASERS; IONIZATION; LASER PRODUCED PLASMAS; SCATTERING; X RAY APPARATUS; X RAY OPTICS;

COMPUTATIONAL TOOLS; HIGH ENERGY DENSITY PLASMAS; PARTIALLY IONIZED PLASMA; SCATTERED INTENSITY; THOMSON SCATTERING; X RAY THOMSON SCATTERING; X-FEL; X-RAY FREE ELECTRON LASERS;

X RAYS;

EID: 84888869196     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.2022449     Document Type: Conference Paper

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