Symmetry analysis of the numerical instabilities in the transfer matrix method

Journal of Optics (United Kingdom)

Volumn 15, Issue 12, 2013, Pages

  Luque Raigon, Jose Miguel ^a,b   Halme, Janne ^a   Miguez, Hernan ^b   Lozano, Gabriel ^b  

^a AALTO UNIVERSITY   (Finland)

^b UNIVERSITY OF SEVILLE   (Spain)

Author keywords

absorption; analytical solution; internal symmetries; numerical instability; total internal reflection; transfer matrix method

Indexed keywords

ABSORPTION; ELECTRIC FIELDS; NUMERICAL METHODS; REFRACTIVE INDEX;

EXPONENTIAL INSTABILITY; EXPONENTIALS; ILL-CONDITIONED; INTERNAL SYMMETRY; NUMERICAL INSTABILITY; REFERENCE SYSTEMS; SYMMETRY ANALYSIS; TOTAL INTERNAL REFLECTIONS;

TRANSFER MATRIX METHOD;

EID: 84888598623     PISSN: 20408978     EISSN: 20408986     Source Type: Journal    
DOI: 10.1088/2040-8978/15/12/125719     Document Type: Article

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