Silicon detector dark matter results from the final exposure of CDMS II

Physical Review Letters

Volumn 111, Issue 25, 2013, Pages

  Agnese, R ^r   Ahmed, Z ^a   Anderson, A J ^d   Arrenberg, S ^t   Balakishiyeva, D ^r   Basu Thakur, R ^b   Bauer, D A ^b   Billard, J ^d   Borgland, A ^h   Brandt, D ^h   Brink, P L ^h   Bruch, T ^t   Bunker, R ^k   Cabrera, B ^j   Caldwell, D O ^o   Cerdeno, D G ^m   Chagani, H ^s   Cooley, J ⁱ   Cornell, B ^a   Crewdson, C H ^f   Cushman, P ^s   Daal, M ⁿ   Dejongh, F ^b   Do Couto E Silva, E ^h   Doughty, T ⁿ   Esteban, L ^m   Fallows, S ^s   Figueroa Feliciano, E ^d   Filippini, J ^a   Fox, J ^f   Fritts, M ^s   Godfrey, G L ^h   Golwala, S R ^a   Hall, J ^e   Harris, R H ^l   Hertel, S A ^d   Hofer, T ^s   Holmgren, D ^b   Hsu, L ^b   Huber, M E ^p   Jastram, A ^l   Kamaev, O ^f   Kara, B ⁱ   Kelsey, M H ^h   Kennedy, A ^s   Kim, P ^h   Kiveni, M ^k   Koch, K ^s   Kos, M ^k   Leman, S W ^d   Loer, B ^b   Lopez Asamar, E ^m   Mahapatra, R ^l   Mandic, V ^s   Martinez, C ^f   McCarthy, K A ^d   Mirabolfathi, N ⁿ   Moffatt, R A ^j   Moore, D C ^a   Nadeau, P ^f   Nelson, R H ^a   Page, K ^f   Partridge, R ^h   Pepin, M ^s   Phipps, A ⁿ   Prasad, K ^l   Pyle, M ⁿ   Qiu, H ⁱ   Rau, W ^f   Redl, P ^j   Reisetter, A ^q   Ricci, Y ^f   Saab, T ^r   Sadoulet, B ^c,n   Sander, J ^l   Schneck, K ^h   Schnee, R W ^k   Scorza, S ⁱ   Serfass, B ⁿ   Shank, B ^j   Speller, D ⁿ   Sundqvist, K M ⁿ   Villano, A N ^s   Welliver, B ^r   Wright, D H ^h   Yellin, S ^j   Yen, J J ^j   Yoo, J ^b   Young, B A ^g   Zhang, J ^s   more..

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^b FERMI NATIONAL ACCELERATOR LABORATORY   (United States)

^c LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^d MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^e PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

^f QUEEN S UNIVERSITY   (Canada)

^g SANTA CLARA UNIVERSITY   (United States)

^h SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

ⁱ SOUTHERN METHODIST UNIVERSITY   (United States)

^j STANFORD UNIVERSITY   (United States)

^k SYRACUSE UNIVERSITY   (United States)

^l TEXAS A AND M UNIVERSITY   (United States)

^m UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

ⁿ UNIVERSITY OF CALIFORNIA   (United States)

^o UNIVERSITY OF CALIFORNIA   (United States)

^p UNIVERSITY OF COLORADO   (United States)

^q UNIVERSITY OF EVANSVILLE   (United States)

^r University of Florida   (United States)

^s University of Minnesota   (United States)

^t PHYSIK INSTITUT DER UNIVERSITÄT ZÜRICH   (Switzerland)

more..

Author keywords

[No Author keywords available]

Indexed keywords

CONFIDENCE LEVELS; DARK MATTER; PROFILE LIKELIHOOD; RECOIL ENERGIES; WEAKLY INTERACTING MASSIVE PARTICLES;

ATOMIC PHYSICS; PHYSICS;

SILICON DETECTORS;

EID: 84888588285     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.111.251301     Document Type: Article

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