Impurities in zone-refining anthracene crystals

Journal of Crystal Growth

Volumn 363, Issue , 2013, Pages 61-68

  Hong, Irvine Huamin ^a   Tan, Ke Jie ^a   Toh, Minglin ^a   Jiang, Hui ^a   Zhang, Keke ^a   Kloc, Christian ^a  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

A1. Defects; A1. Impurities; A1. Purification; A2. Single crystal growth; B1. Aromatic compounds; B2. Scintillator materials

Indexed keywords

ANTHRACENE; ATOMIC FORCE MICROSCOPY; CHARACTERIZATION; CRYSTAL GROWTH; FOURIER TRANSFORM INFRARED SPECTROSCOPY; IMPURITIES; INDUCTIVELY COUPLED PLASMA; IONIZATION; MASS SPECTROMETRY; PURIFICATION; RADIATION DETECTORS; REFINING; SCINTILLATION COUNTERS; SINGLE CRYSTALS; X RAY DIFFRACTION; ZONE MELTING;

CHARACTERIZATION STUDIES; FLUORESCENCE MEASUREMENTS; FOURIER TRANSFORM INFRA RED (FTIR) SPECTROSCOPY; GROWN FROM THE MELTS; LASER DESORPTION IONIZATION; PHOTOLUMINESCENCE ANALYSIS; POWDER X RAY DIFFRACTION; SCINTILLATOR MATERIALS;

CRYSTAL IMPURITIES;

EID: 84888338100     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2012.10.002     Document Type: Article

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