Structural investigation of nanoporous alumina film with grazing incidence small angle X-ray scattering

Physica Status Solidi (A) Applications and Materials Science

Volumn 210, Issue 11, 2013, Pages 2521-2525

  Buttard, D ^a,b   Schulli T ^c   Lazzari, R ^d  

^a CEA GRENOBLE   (France)

^b UNIV GRENOBLE ALPES   (France)

^c EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^d SORBONNE UNIVERSITÉ   (France)

Author keywords

GISAXS; nanoporous alumina; structure

Indexed keywords

CYLINDRICAL GEOMETRY; GI-SAXS; GRAZING INCIDENCE SMALL-ANGLE X-RAY SCATTERING; NANOPOROUS ALUMINA; NANOPOROUS ALUMINA FILMS; STRUCTURAL CHARACTERIZATION; STRUCTURAL INVESTIGATION; SYNCHROTRON SOURCE;

CYLINDERS (SHAPES); OPTICS; SCATTERING; SILICON WAFERS; STRUCTURE (COMPOSITION); X RAY SCATTERING;

ALUMINA;

EID: 84888199228     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.201330024     Document Type: Article

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