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Volumn , Issue , 2008, Pages 485-491
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ALMA band 10 optics tolerance analysis
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Author keywords
[No Author keywords available]
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Indexed keywords
APERTURE EFFICIENCY;
INTERFACE LEVEL;
MECHANICAL STRUCTURES;
MECHANICAL TOLERANCES;
OPTICS SIMULATIONS;
RAY-TRACING METHOD;
TIGHT TOLERANCES;
TOLERANCE ANALYSIS;
PHYSICAL OPTICS;
FITS AND TOLERANCES;
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EID: 84888055354
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (5)
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References (8)
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