Multistate degradation and supervised estimation methods for a condition-monitored device

IIE Transactions (Institute of Industrial Engineers)

Volumn 46, Issue 2, 2014, Pages 131-148

  Moghaddass, Ramin ^a   Zuo, Ming J ^a  

^a UNIVERSITY OF ALBERTA   (Canada)

Author keywords

Condition monitoring; Degradation process; Multistate reliability; Supervised estimation

Indexed keywords

DEGRADATION PROCESS; ESTIMATION METHODS; MAXIMUM LIKELIHOOD ESTIMATOR; MECHANICAL DEVICE; MULTI-STATE RELIABILITY; NON-PARAMETRIC ESTIMATIONS; NUMERICAL EXPERIMENTS; SEMI MARKOV PROCESS;

CONDITION MONITORING; MARKOV PROCESSES;

ESTIMATION;

EID: 84887938937     PISSN: 0740817X     EISSN: 15458830     Source Type: Journal    
DOI: 10.1080/0740817X.2013.770188     Document Type: Article

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