Bilateral blue noise sampling

ACM Transactions on Graphics

Volumn 32, Issue 6, 2013, Pages

  Chen, Jiating ^a   Ge, Xiaoyin ^b   Wei, Li Yi ^c,d   Wang, Bin ^a   Wang, Yusu ^b   Wang, Huamin ^b   Fei, Yun ^a   Qian, Kang Lai ^a   Yong, Jun Hai ^a   Wang, Wenping ^c  

^a TSINGHUA UNIVERSITY   (China)

^b OHIO STATE UNIVERSITY   (United States)

^c UNIVERSITY OF HONG KONG   (Hong Kong)

^d MICROSOFT RESEARCH   (United States)

Author keywords

Bilateral measure; Blue noise; Object distribution; Photon mapping; Point cloud; Stochastic sampling

Indexed keywords

BILATERAL MEASURE; BLUE NOISE; OBJECT DISTRIBUTION; PHOTON MAPPING; POINT CLOUD; STOCHASTIC SAMPLING;

MODULATION; PHOTONS;

IMPORTANCE SAMPLING;

EID: 84887851112     PISSN: 07300301     EISSN: 15577368     Source Type: Journal    
DOI: 10.1145/2508363.2508375     Document Type: Article

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