Dielectric properties and impedance analysis of K 0.5 Na 0.5 NbO 3- Ba 2 NaNb 5 O 15 ceramics with good dielectric temperature stability

Journal of the American Ceramic Society

Volumn 96, Issue 11, 2013, Pages 3489-3493

  Chen, Xiuli ^a   Wang, Yiliang ^a   Chen, Jie ^a   Zhou, Huanfu ^a   Fang, Liang ^a   Liu, Laijun ^a  

^a GUILIN UNIVERSITY OF TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MEASUREMENTS; DIELECTRIC-TEMPERATURE STABILITY; IMPEDANCE ANALYSIS; IMPEDANCE SPECTROSCOPY; IONIC CHARGE CARRIERS; SOLID STATE REACTION METHOD; THERMALLY ACTIVATED; WIDE TEMPERATURE RANGES;

DIELECTRIC PROPERTIES; NIOBIUM OXIDE; RELAXATION PROCESSES; SODIUM; SOLID STATE REACTIONS; X RAY DIFFRACTION ANALYSIS;

CERAMIC MATERIALS;

EID: 84887767626     PISSN: 00027820     EISSN: 15512916     Source Type: Journal    
DOI: 10.1111/jace.12514     Document Type: Article

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