Plasma property effects on spectral line broadening in double-pulse Laser-Induced Breakdown Spectroscopy

Applied Physics A: Materials Science and Processing

Volumn 110, Issue 4, 2013, Pages 785-792

  Choi, Inhee ^a   Mao, Xianglei ^a   Gonzalez, J Jhanis ^a   Russo, Richard E ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DOUBLE-PULSE EXCITATION; DOUBLE-PULSE LASER-INDUCED BREAKDOWN SPECTROSCOPIES; ELECTRON-DENSITY EFFECTS; EMISSION SPECTRAL; ORTHOGONAL CONFIGURATIONS; PLASMA TEMPERATURE; SIGNAL INTENSITIES; TEMPORALLY RESOLVED;

ATMOSPHERIC PRESSURE; ATOMIC EMISSION SPECTROSCOPY; CARRIER CONCENTRATION; ELECTRON DENSITY MEASUREMENT; ELECTRONS; SPECTROSCOPY;

PLASMAS;

EID: 84887468724     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s00339-012-7153-6     Document Type: Article

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