SCOPUS 정보 검색 플랫폼

Volumn 548, Issue , 2013, Pages 118-124

Effect of potassium content on electrostrictive properties of Na 0.5Bi0.5TiO3-based relaxor ferroelectric thin films with morphotropic phase boundary

(7) Zheng, X J a,b Liu, J Y b Peng, J F b Liu, X b Gong, Y Q b Zhou, K S c Huang, D H c

a UNIVERSITY OF SHANGHAI FOR SCIENCE AND TECHNOLOGY (China)

b XIANGTAN UNIVERSITY (China)

c CENTRAL SOUTH UNIVERSITY (China)

Author keywords

Electrostriction coefficient; Electrostrictive equation; Electrostrictive strain; Morphotropic phase boundary; Na0.5Bi0.5TiO 3 based thin film; Relaxor ferroelectric

Indexed keywords

ELECTROSTRICTION COEFFICIENT; ELECTROSTRICTIVE; ELECTROSTRICTIVE STRAIN; MORPHOTROPIC PHASE BOUNDARIES; RELAXOR FERROELECTRIC; TIO;

ELECTROMECHANICAL DEVICES; FERROELECTRIC MATERIALS; FERROELECTRIC THIN FILMS; FERROELECTRICITY; PHASE BOUNDARIES; PIEZOELECTRICITY; POTASSIUM; SCANNING ELECTRON MICROSCOPY; SCANNING PROBE MICROSCOPY; SODIUM; STRAIN; THIN FILMS;

ELECTROSTRICTION;

EID: 84887430406 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2013.09.017 Document Type: Article

Times cited : (37)

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