Occlusion patterns for object class detection

Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition

Volumn , Issue , 2013, Pages 3286-3293

  Pepikj, Bojan ^a   Stark, Michael ^a,b   Gehler, Peter ^c   Schiele, Bernt ^a  

^a MAX PLANCK INSTITUTE FOR INFORMATICS   (Germany)

^b STANFORD UNIVERSITY   (United States)

^c MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

DPM; object detection; occlusion

Indexed keywords

ANNOTATED TRAINING DATA; DPM; FURTHER DEVELOPMENT; OBJECT CLASS DETECTIONS; OBJECT DETECTION; OBJECT-CLASS RECOGNITION SYSTEMS; OCCLUSION; PART-BASED REPRESENTATION;

COMPUTER SCIENCE; ELECTRICAL ENGINEERING; PATTERN RECOGNITION; SOFTWARE ENGINEERING;

OBJECT RECOGNITION;

EID: 84887391806     PISSN: 10636919     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CVPR.2013.422     Document Type: Conference Paper

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