Successful GaAs backend process improvement

2012 International Conference on Compound Semiconductor Manufacturing Technology, CS MANTECH 2012

Volumn , Issue , 2012, Pages

  Hand, Tom ^a   Farmosa, Scott ^a   Welborn, Jennifer ^a   Nercessian, Daniel ^a  

^a SKYWORKS SOLUTIONS INC   (United States)

Author keywords

Breakage reduction; Grinding; Thinning; Yield

Indexed keywords

DECISION MAKING PROCESS; GAAS WAFER; PROBLEM SOLVING METHODS; PROCESS IMPROVEMENT; REDUCTION STRATEGY; SIX-SIGMA METHODOLOGY; THINNING; YIELD;

GALLIUM ARSENIDE; GRINDING (MACHINING); SEMICONDUCTOR DEVICE MANUFACTURE;

SEMICONDUCTING GALLIUM;

EID: 84887386074     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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