Spectral multidimensional scaling

Proceedings of the National Academy of Sciences of the United States of America

Volumn 110, Issue 45, 2013, Pages 18052-18057

  Aflalo, Yonathan ^a   Kimmel, Ron ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

Big data; Diffusion geometry; Distance maps; Flat embedding

Indexed keywords

ACCURACY; ARTICLE; COST; DATA ANALYSIS; DATA PROCESSING; EMBEDDING; MEMORY; MODEL; MULTIDIMENSIONAL SCALING; OPERATOR; PRIORITY JOURNAL;

BIG DATA; DIFFUSION GEOMETRY; DISTANCE MAPS; FLAT EMBEDDING;

DATA INTERPRETATION, STATISTICAL; MATHEMATICAL CONCEPTS; MODELS, THEORETICAL; PRINCIPAL COMPONENT ANALYSIS;

EID: 84887295087     PISSN: 00278424     EISSN: 10916490     Source Type: Journal    
DOI: 10.1073/pnas.1308708110     Document Type: Article

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