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Volumn 114, Issue 16, 2013, Pages

Suspended single-layer MoS2 devices

Author keywords

[No Author keywords available]

Indexed keywords

BUFFERED OXIDE ETCHANTS; E-BEAM LITHOGRAPHY; ON/OFF RATIO; OPTIMAL DEVICES; SINGLE LAYER; SUBSTRATE EFFECTS;

EID: 84887278598     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4827477     Document Type: Article
Times cited : (64)

References (25)
  • 5
    • 36349006287 scopus 로고    scopus 로고
    • 10.1021/jp075424v
    • T. S. Li and G. L. Galli, J. Phys. Chem. C 111, 16192-16196 (2007). 10.1021/jp075424v
    • (2007) J. Phys. Chem. C , vol.111 , pp. 16192-16196
    • Li, T.S.1    Galli, G.L.2
  • 19
    • 84887295568 scopus 로고    scopus 로고
    • See supplementary material at E-JAPIAU-114-084341 for failure of suspension (Fig. S1), capacitance calculation for a specific geometry using a commercial code (Fig. S2), and performance of other devices (Fig. S3).
    • See supplementary material at http://dx.doi.org/10.1063/1.4827477 E-JAPIAU-114-084341 for failure of suspension (Fig. S1), capacitance calculation for a specific geometry using a commercial code (Fig. S2), and performance of other devices (Fig. S3).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.