SCOPUS 정보 검색 플랫폼

Journal of Alloys and Compounds

Volumn 586, Issue , 2014, Pages 683-687

Effects of annealing temperature on the microstructure, electrical properties of Fe-doped Na0.5Bi0.5TiO3 thin films

(5) Sui, Huiting a Yang, Changhong a,b Zhao, Mingshi a Lin, Weiqiang a Feng, Chao a

a UNIVERSITY OF JINAN (China)

b SHANDONG UNIVERSITY (China)

Author keywords

Chemical synthesis; Ferroelectrics; Thin films

Indexed keywords

ANNEALING; BISMUTH COMPOUNDS; DEPOSITION; FERROELECTRIC MATERIALS; FERROELECTRICITY; GRAIN BOUNDARIES; IRON COMPOUNDS; LANTHANUM COMPOUNDS; NICKEL COMPOUNDS; OXYGEN VACANCIES; PEROVSKITE; PIEZOELECTRICITY; POLARIZATION; SODIUM COMPOUNDS; SYNTHESIS (CHEMICAL);

ANNEALING TEMPERATURES; CHEMICAL SOLUTION DEPOSITION; FERROELECTRIC AND DIELECTRIC PROPERTIES; INTERNAL BIAS FIELD; PEROVSKITE STRUCTURES; PIEZOELECTRIC COEFFICIENT; SELF POLARIZATION; TEMPERATURE RANGE;

THIN FILMS;

EID: 84887265324 PISSN: 09258388 EISSN: None Source Type: Journal
DOI: 10.1016/j.jallcom.2013.10.117 Document Type: Letter

Times cited : (16)

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