Effect of intrinsic surface roughness and other decay processes on surface plasmon polariton resonance halfwidth

Proceedings - IEEE Ultrasonics Symposium

Volumn 1992-October, Issue , 1992, Pages 509-514

  Negm, Sohair ^a   Talaat, Hassan ^a  

^a Ain Shams University   (Egypt)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE POLARIZATION; ELECTROMAGNETIC WAVE REFLECTION; FORWARD SCATTERING; PARTICLE OPTICS; PHONONS; PHOTONS; SURFACE PLASMON RESONANCE; SURFACE PLASMONS;

ATTENUATED TOTAL REFLECTIONS; COMPARATIVE STUDIES; INTRINSIC SURFACES; RESONANCE COUPLINGS; SCATTERING PROCESS; SURFACE PLASMON POLARITONS; SURFACE PLASMON POLARITONS (SPP); THIN AG FILMS;

SURFACE ROUGHNESS;

EID: 84887175887     PISSN: 10510117     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ULTSYM.1992.275955     Document Type: Conference Paper

References (14)

1. S. Negm and H. Talaat; J. Phys.: Condens. Matter 10201-10205 (1989).
2. W. L. Barnes and J. R. Sambles; Solid State Com. Vol. 55, No. 11, pp. 921-923 (1985).
3. H. Raether; Physics of Thin films, Vol. 9 Academic Press (1972)
4. A, Rosencweig; Opt. Commun. 7, 305 (1973).
5. I. Inagaki, K. Kagani and E. T. Arakawa; Applied Optics 21, 949 (1982).
6. H. Raether; Surface Plasmons on Smooth and Rough Surfaces and on Gratings - Springer - Verlag, Berlin Heidelberg New York (1988).
7. E, Kretschmann; Opt. Comm. 10, 356 (1974);
8. Proc. Int. Conf. on "Thin Films", Venice (1972).
9. A. Soliman; Thesis, Ain Shams Univ. ch. (5) (1990).
10. E. Burstein, W. P. Chen, J. Chen and A. Harstein; J. Vac. Sci. Technol. 11, 6, 1004 (1979).
11. E. Kretschmann; Opt. Comm. 5, 331 (1972).
12. A. A. Maraduden and D. L. Mills; Phys. Rev. 811, 1392 (1975).
13. S. I. Yaniger; Ph. D. Dissertation, University of Utah (1984).
14. R. A. Young and D. B. Wiles; J. Appl. Cryst. 15, 430-438 (1982).