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Volumn 43, Issue 1, 2013, Pages 196-207

Petri net modeling and cycle-time analysis of dual-arm cluster tools with wafer revisiting

Author keywords

Cluster tool; Discrete event system; Petri nets (PNs); Scheduling; Semiconductor manufacturing.

Indexed keywords

CLUSTER TOOL; OPTIMALITY CONDITIONS; PETRI NET MODELS; PETRI NETS (PNS); SEMICONDUCTOR MANUFACTURING; SYSTEMATIC METHOD; TRANSIENT STATE; WAFER FABRICATIONS;

EID: 84887067395     PISSN: 10834427     EISSN: None     Source Type: Journal    
DOI: 10.1109/TSMCA.2012.2187890     Document Type: Article
Times cited : (175)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.