Advanced atomic force microscopy techniques

Beilstein Journal of Nanotechnology

Volumn 3, Issue 1, 2012, Pages 893-894

  Glatzel, Thilo ^a   Hölscher, Hendrik ^b   Schimmel, Thomas ^b   Baykara, Mehmet Z ^c   Schwarz, Udo D ^d   Garcia, Ricardo ^e  

^a UNIVERSITY OF BASEL   (Switzerland)

^b KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

^c BILKENT UNIVERSITY   (Turkey)

^d Yale University   (United States)

^e ISAAC NEWTON GROUP OF TELESCOPES   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84887012710     PISSN: None     EISSN: 21904286     Source Type: Journal    
DOI: 10.3762/bjnano.3.99     Document Type: Article

References (0)