Comparison between positive and negative constant current stress on dye-sensitized solar cells

Microelectronics Reliability

Volumn 53, Issue 9-11, 2013, Pages 1804-1808

  Bari, D ^a   Wrachien, N ^a   Tagliaferro, R ^b   Brown, T M ^b   Reale, A ^b   Di Carlo, A ^b   Meneghesso, G ^a   Cester, A ^a  

^a UNIVERSITY OF PADOVA   (Italy)

^b UNIVERSITY OF ROME TOR VERGATA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

DC PARAMETERS; DEGRADATION RATE; DIFFERENT EFFECTS; DYE-SENSITIZED SOLAR CELL; IMPEDANCE MEASUREMENT; NEGATIVE CONSTANTS; STRESS CURRENT; TIO;

DEGRADATION; PHOTOELECTROCHEMICAL CELLS;

SOLAR CELLS;

EID: 84886884344     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2013.07.093     Document Type: Conference Paper

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