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Volumn , Issue , 1992, Pages 20-24
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A more complete analysis for subnyquist band-pass sampling
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Author keywords
[No Author keywords available]
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Indexed keywords
EXPERT SYSTEMS;
SYSTEM THEORY;
VLSI CIRCUITS;
BAND PASS;
BAND-PASS SAMPLING;
IN-BAND;
NYQUIST LIMITS;
SAMPLING FREQUENCIES;
SIGNAL PROCESSING;
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EID: 84886758347
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/SSST.1992.712172 Document Type: Conference Paper |
Times cited : (7)
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References (5)
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