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Volumn , Issue , 2005, Pages 586-591

Dummy filling methods for reducing interconnect capacitance and number of fills

Author keywords

[No Author keywords available]

Indexed keywords

DUMMY FILLINGS; FLOATING DUMMY; INTERCONNECT CAPACITANCE; ORDERS OF MAGNITUDE; PARALLEL LINE; PLANARIZATION; SIGNAL LINES; SYSTEM ON CHIP DESIGN;

EID: 84886703433     PISSN: 19483287     EISSN: 19483295     Source Type: Conference Proceeding    
DOI: 10.1109/ISQED.2005.47     Document Type: Conference Paper
Times cited : (35)

References (12)
  • 2
    • 84942095251 scopus 로고    scopus 로고
    • Impact of interconnect pattern density information on a 90nm technology ASIC design flow
    • P. Zarkesh-Ha, S. Lakshminarayann, K. Doniger, W. Loh, and P. Wright, "Impact of interconnect pattern density information on a 90nm technology ASIC design flow," Proc. of ISQED, pp. 405-409, 2003.
    • (2003) Proc. of ISQED , pp. 405-409
    • Zarkesh-Ha, P.1    Lakshminarayann, S.2    Doniger, K.3    Loh, W.4    Wright, P.5
  • 3
    • 0344033899 scopus 로고    scopus 로고
    • Electrical characterization of the copper CMP process and derivation of metal layout rules
    • Nov
    • S. Lakshminarayanan, P. J. Wright, and J. Pallinti, "Electrical characterization of the copper CMP process and derivation of metal layout rules," IEEE Trans. Semiconduct. Manufact., vol. 16, no. 4, pp. 668-676, Nov. 2003.
    • (2003) IEEE Trans. Semiconduct. Manufact. , vol.16 , Issue.4 , pp. 668-676
    • Lakshminarayanan, S.1    Wright, P.J.2    Pallinti, J.3
  • 4
    • 84942123552 scopus 로고    scopus 로고
    • Investigation of the capacitance deviation due to metal-fills and the effective interconnect geometry modeling
    • W.-S. Lee, K.-H. Lee, J.-K. Park, T.-K. Kim, Y.-K. Park, and J.-T. Kong, "Investigation of the capacitance deviation due to metal-fills and the effective interconnect geometry modeling," Proc. of ISQED, pp. 373-376, 2003.
    • (2003) Proc. of ISQED , pp. 373-376
    • Lee, W.-S.1    Lee, K.-H.2    Park, J.-K.3    Kim, T.-K.4    Park, Y.-K.5    Kong, J.-T.6
  • 5
    • 0033682012 scopus 로고    scopus 로고
    • An exhaustive method for characterizing the interconnect capacitance considering the floating dummyfills by employing an efficient field solving algorithm
    • Sept
    • J.-K. Park, K.-H. Lee, J.-H. Lee, Y.-K. Park, and J.-T. Kong, "An exhaustive method for characterizing the interconnect capacitance considering the floating dummyfills by employing an efficient field solving algorithm," Proc. of SISPAD, pp. 98-101, Sept. 2002.
    • (2002) Proc. of SISPAD , pp. 98-101
    • Park, J.-K.1    Lee, K.-H.2    Lee, J.-H.3    Park, Y.-K.4    Kong, J.-T.5
  • 6
    • 0035716853 scopus 로고    scopus 로고
    • Analyzing the effects of floating dummy-fills: From feature scale analysis to fullchip RC extraction
    • Dec
    • K.-H. Lee, J.-K. Park, Y.-N. Yoon, D.-H. Jung, J.-P. Shin, Y.-K. Park, and J.-T. Kong, "Analyzing the effects of floating dummy-fills: from feature scale analysis to fullchip RC extraction," Proc. of IEDM, pp. 685-688, Dec. 2001.
    • (2001) Proc. of IEDM , pp. 685-688
    • Lee, K.-H.1    Park, J.-K.2    Yoon, Y.-N.3    Jung, D.-H.4    Shin, J.-P.5    Park, Y.-K.6    Kong, J.-T.7
  • 7
    • 17044386168 scopus 로고    scopus 로고
    • Efficient capacitance extraction method for interconnects with dummy fills
    • Oct
    • A. Kurokawa, T. Kanamoto, A. Kasebe, Y. Inoue, and H. Masuda, "Efficient capacitance extraction method for interconnects with dummy fills," Proc. of CICC, pp. 485-488, Oct. 2004.
    • (2004) Proc. of CICC , pp. 485-488
    • Kurokawa, A.1    Kanamoto, T.2    Kasebe, A.3    Inoue, Y.4    Masuda, H.5
  • 9
    • 0041589397 scopus 로고    scopus 로고
    • Performance-impact limited area fill synthesis
    • Y.Chen, P.Gupta, and A.B.Kahng, "Performance-impact limited area fill synthesis," Proc. of DAC, pp.22-27, 2003.
    • (2003) Proc. of DAC , pp. 22-27
    • Chen, Y.1    Gupta, P.2    Kahng, A.B.3
  • 10
    • 17044424684 scopus 로고    scopus 로고
    • An efficient algorithm for 3D interconnect capacitance extraction considering floating conductors
    • Sept
    • O. Cueto, F. Charlet, and A. Farcy, "An efficient algorithm for 3D interconnect capacitance extraction considering floating conductors," Proc. of SISPAD, pp. 107-110, Sept. 2002.
    • (2002) Proc. of SISPAD , pp. 107-110
    • Cueto, O.1    Charlet, F.2    Farcy, A.3
  • 11
    • 84886651506 scopus 로고    scopus 로고
    • Raphael version 2003. 09, Synopsys Corporation
    • Raphael version 2003.09, Synopsys Corporation.
  • 12
    • 84886699514 scopus 로고    scopus 로고
    • International technology roadmap for semiconductors: Semiconductor Industry Association, 2003
    • International technology roadmap for semiconductors: Semiconductor Industry Association, 2003.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.