Long term endurance test and contact degradation of CIGS solar cells

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 8825, Issue , 2013, Pages

  Ott, Thomas ^a   Schönberger, Francillina ^a   Walter, Thomas ^a   Hariskos, Dimitrios ^b   Kiowski, Oliver ^b   Schäffler, Raymund ^c  

^a ULM UNIVERSITY OF APPLIED SCIENCES   (Germany)

^b ZENTRUM FÜR SONNENENERGIE UND WASSERSTOFF FORSCHUNG BADEN WÜRTTEMBERG ZSW   (Germany)

^c Manz CIGS Technology GmbH   (Germany)

Author keywords

Accelerated ageing; Back barrier; CIGS; Contact degradation; Endurance test

Indexed keywords

ACCELERATED AGEING; BACK BARRIERS; CIGS; CONTACT DEGRADATION; ENDURANCE TEST;

COMPUTER SIMULATION; DIODES; OPEN CIRCUIT VOLTAGE; PHOTOELECTROCHEMICAL CELLS; PHOTOVOLTAIC CELLS; RELIABILITY; SOLAR CELLS;

EFFICIENCY;

EID: 84886688779     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.2024132     Document Type: Conference Paper

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