A built-in self-test scheme for differential ring oscillators

Proceedings - International Symposium on Quality Electronic Design, ISQED

Volumn , Issue , 2005, Pages 448-452

  Dermentzoglou, L ^a   Tsiatouhas, Y ^b   Arapoyanni, A ^a  

^a UNIVERSITY OF ATHENS   (Greece)

^b UNIVERSITY OF IOANNINA   (Greece)

Author keywords

[No Author keywords available]

Indexed keywords

BRIDGING FAULT; BUILTIN SELF-TEST (BIST); CIRCUIT UNDER TEST; DIFFERENTIAL RINGS; DIFFERENTIAL VOLTAGE; EXHAUSTIVE SIMULATION; FAULT COVERAGES; INDICATION SIGNAL;

BUILT-IN SELF TEST;

EID: 84886680219     PISSN: 19483287     EISSN: 19483295     Source Type: Conference Proceeding    
DOI: 10.1109/ISQED.2005.2     Document Type: Conference Paper

References (6)

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