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Volumn , Issue , 2013, Pages 2364-2367
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A new tool for quantifying and characterizing asymmetry in bilaterally paired structures
a b a a c,d,e |
Author keywords
[No Author keywords available]
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Indexed keywords
CLUSTER FEATURE;
DEFORMABLE REGISTRATION;
DEFORMATION VECTORS;
IMAGE DISTANCE;
POINT CORRESPONDENCE;
REGIONS OF INTEREST;
SIMILARITY MEASURE;
VECTOR FIELDS;
DEFORMATION;
TOOLS;
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EID: 84886512242
PISSN: 1557170X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/EMBC.2013.6610013 Document Type: Conference Paper |
Times cited : (7)
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References (6)
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