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Volumn 312, Issue , 2014, Pages 292-295

A THz-TDS measurement method for multiple samples

Author keywords

Multiple samples; Numerical simulation; THz TDS

Indexed keywords

CONVENTIONAL METHODS; DATA REPRODUCIBILITY; DELAY TIME; ELECTRIC-FIELD AMPLITUDE; MEASUREMENT METHODS; MULTIPLE SAMPLES; PERIODIC FLUCTUATIONS; THZ-TDS;

EID: 84886463876     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2013.09.013     Document Type: Article
Times cited : (11)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.